This standard specifies extensions to IEEE Std. 1450-1999 that define the description of certain test flow and binning components of an Integrated Circuit (IC) test program in a test-hardware independent manner. These extensions provide language constructs and semantics necessary to describe both the test program flow as well as sequencing data needed to compose a test program to run on an Automated Test Equipment (ATE) platform. The language constructs defined include structures for specifying: *Order of execution of test program components *Hierarchical test flow structures to facilitate automated modification or maintenance *Common interfaces between the test flow environment and test program components *Test flow variables to facilitate concurrent and serial test flow interactions *Binning or categorization of tested ICs
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