Tag: Instrumentation and Measurement

IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions

The guide specifies procedures for testing equipment when external insulation of the test object is subjected to combinations of contamination, ice, snow, or cold fog. The methods are applicable only…

IEC/IEEE International Standard – Standard Test Interface Language (STIL) for Digital Test Vector Data

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test…

IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1)…

IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on…

IEEE Standard for Organizational Reliability Capability

Organizational reliability capability and the identification of the criteria for assessing the reliability capability of an organization are defined.

IEEE Standard for Memory Modeling in Core Test Language

Reuse of test data and test structures developed for individual cores (designs) when integrated into larger integrated circuits is required for system-on-chip (SoC) tests. This standard defines language constructs sufficient…

IEC/IEEE International Standard – Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)

AI-ESTATE is a set of specifications for data interchange and for standard services for the test and diagnostic environment. The purpose of AI-ESTATE is to standardize interfaces between functional elements…

IEEE Standard for Describing On-Chip Scan Compression

This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for…

IEEE Standard for a Mixed-Signal Test Bus

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of…