This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.
- Standard Committee
- C/TT - Test Technology
- Status
- Inactive-Reserved Standard
- PAR Approval
- 2007-02-27
- Board Approval
- 2009-05-13
- History
-
- ANSI Approved:
- 2009-11-09
- Published:
- 2009-07-13
- Inactivated Date:
- 2020-03-05
Working Group Details
- Society
- IEEE Computer Society
- Standard Committee
- C/TT - Test Technology
- Working Group
-
OCI - Standard For Describing On-chip Scan Compression
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Bruce Cory
Other Activities From This Working Group
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