Working Group Details
HI_WG - Hardware Interfaces Working Group
|Working Group Chair||
IEEE-SASB Coordinating Committees
|IEEE Program Manager|
IEEE 1505.1-2008 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
IEEE 1505.3-2015 - IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
Portable/benchtop test equipment applications are supported in this document by defining a mass interconnection scheme and pin configuration based upon IEEE Std 1505(TM)-2010 and IEEE Std 1505.1(TM)-2015. Particular emphasis has been placed on defining a more specific set of performance requirements than is defined by IEEE Std 1505-2010 and IEEE Std 1505.1-2015. These performance requirements are in the areas of the pin configuration, specific connector modules, and respective contacts.