The scope of this recommended practice is the performance of surge testing on electrical and electronic equipment connected to low-voltage ac power circuits, specifically using there commended test waveform defined in IEEE Std C62.41.2-2002. Nevertheless, these recommendations are applicable to any surge testing, regardless of the specific surges that may be applied.
- Standard Committee
- PE/SPDLV - Surge Protective Devices/Low Voltage
- Status
- Inactive-Reserved Standard
- PAR Approval
- 2001-06-14
- Superseding
- C62.45-1992
- Board Approval
- 2002-11-11
- History
-
- ANSI Approved:
- 2003-03-10
- Published:
- 2003-04-11
- Reaffirmed:
- 2008-12-10
- Inactivated Date:
- 2019-11-07
Working Group Details
- Society
- IEEE Power and Energy Society
- Standard Committee
- PE/SPDLV - Surge Protective Devices/Low Voltage
- Working Group
-
LV3.6.4 - 3.6.4 Surge Characterization on LV Circuits WG
- IEEE Program Manager
- Christian Orlando
Contact Christian Orlando - Working Group Chair
- Douglas Dorr
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
PC62.41.2
Recommended Practice on Characterization of Surges in Low-Voltage (1000 V and less) AC Power Circuits
The scope of this recommended practice is to characterize the surge environment at locations on ac power circuits described in IEEE Std C62.41.1 by means of standardized waveforms and other stress parameters. The surges considered in this recommended practice do not exceed one half-cycle of the normal mains waveform (fundamental frequency) in duration. They can be periodic or random events and can appear in any combination of line, neutral, or grounding conductors. They include surges with amplitudes, durations, or rates of change sufficient to cause equipment damage or operational upset. While surge protective devices (SPDs) acting primarily on the amplitude of the voltage or current are often applied to divert the damaging surges, the upsetting surges might require other remedies.
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