Active PAR

IEEE P2818

IEEE Draft Standard for Reliability Component Stress Analysis and Derating Specification

This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component's reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.

Sponsor Committee
RS/SC - IEEE Reliability
Active PAR
PAR Approval

Working Group Details

IEEE Reliability Society
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Sponsor Committee
RS/SC - IEEE Reliability
Working Group
Derating - Reliability Stress Analysis and Derating Working Group
IEEE Program Manager
Christy Bahn
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Working Group Chair
Lori Bechtold

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.

No Active Projects

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.

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These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.

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These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.

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