An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Status
- Active Standard
- PAR Approval
- 2010-06-17
- Superseding
- 1671.1-2009
- Corrigendum
-
1671.1-2017/Cor 1-2023
- Board Approval
- 2017-12-06
- History
-
- Published:
- 2018-03-19
Additional Resources
- Downloads
- 1671.1-2017_downloads.zip
Working Group Details
- Society
- Society
- IEEE SA Board of Governors
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Working Group
-
TAD_WG - Test and ATS Description Working Group
- IEEE Program Manager
- Chinmae Deshmukkh
Contact Chinmae Deshmukkh - Working Group Chair
- Ion Neag
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
1671.1-2017/Cor 1-2023
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1671 directory here: https://standards.ieee.org/wp-content/uploads/2024/04/1671.1-2017-cor1-2023-downloads.zip
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