Active Standard

IEEE 1671.1-2017/Cor 1-2023

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1

Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1671 directory here: https://standards.ieee.org/wp-content/uploads/2024/04/1671.1-2017-cor1-2023-downloads.zip

Sponsor Committee
BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Status
Active Standard
PAR Approval
2019-11-07
Board Approval
2023-12-06
History
Published:
2024-04-26

Additional Resources

Downloads
1671.1-2017-cor1-2023-downloads.zip

Working Group Details

Society
IEEE SA Board of Governors
Sponsor Committee
BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Working Group
1671.1_Cor1 - IEEE 1671.1 Corrigendum 1 WG
IEEE Program Manager
Christian Orlando
Contact Christian Orlando
Working Group Chair
Ion Neag

Other Activities From This Working Group

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