This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the life cycle of test program sets (TPSs) that will be used in an automatic test environment.
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems - Status
- Active Standard
- PAR Approval
- 2019-11-07
- Board Approval
- 2023-12-06
Working Group Details
- Society
- IEEE SA Board of Governors
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems - Working Group
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1671.1_Cor1 - IEEE 1671.1 Corrigendum 1 WG
- IEEE Program Manager
- Christian Orlando
Contact Christian Orlando - Working Group Chair
- Ion Neag
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