Inactive-Reserved Standard

IEEE 1658-2011

IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.

Sponsor Committee
IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
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Status
Inactive-Reserved Standard
PAR Approval
2011-03-31
Board Approval
2011-10-31
History
ANSI Approved:
2012-12-10
Published:
2012-02-10
Inactivated Date:
2022-03-24

Working Group Details

Society
IEEE Instrumentation and Measurement Society
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Sponsor Committee
IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
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Working Group
DAC - Digital-to-Analog Converter Devices
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IEEE Program Manager
Vanessa Lalitte
Contact
Working Group Chair
Luca De Vito

P1658

Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.

Learn More

No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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