Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
- Standard Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
- Status
- Active Standard
- PAR Approval
- 2018-06-14
- Superseding
- 1658-2011
- Board Approval
- 2023-06-05
- History
-
- Published:
- 2024-12-10
Working Group Details
- Society
- IEEE Instrumentation and Measurement Society
- Standard Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
- Working Group
-
DAC - Digital-to-Analog Converter Devices
- IEEE Program Manager
- Patrycja Jarosz
Contact Patrycja Jarosz - Working Group Chair
- N Paulter
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
1658-2011
IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.