IEEE Standards Association
IEEE Project
P1687 - Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
This standard develops a methodology for access to embedded instrumentation without defining the instruments or their features themselves, via the IEEE 1149.1 Test Access Port (TAP) and additional signals that may be required. The elements of the methodology include a description language for the characteristics of the features and for communication with the features, and requirements for interfacing to the features.
- Status:
Working Group: IJTAG - Internal Joint Test Action Group
Sponsor: C/TT - Test Technology 
Society: C - IEEE Computer Society
Get Involved In The Development Of This Standard
Contact the IEEE-SA Liaison Simply click here to voice your interest. Kathryn Bennett
Learn More About Standards ParticipationAnyone can participate, there are a variety of programs and services to
facilitate the involvement of industry and the public. More
Become a Member and Ballot on this StandardMembership empowers you to participate & lead in the development of
standards. Tell Me More
Standards Help
IEEE-SA Standards Development Services are proven to expedite the process by 40%. Click here to learn more!