This standard enables development of interoperable, re-usable elements of the 1149.1 test architecture, particularly those that relate to the interfacing of test data registers. This approach promotes the use of design methodologies wherein such elements can be sourced by different parties.This standard defines an interface that provides for connection of test data registers to an IEEE 1149.1 Test Access Port (TAP) and its associated TAP Controller and Instruction Register.
Sponsor: C/TT - Test Technology
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