Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or equal to 1000…
Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms…
Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms…
This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V…
Applications information on fixed voltage and gated thyristor surge protective devices(SPDs) are provided. Key device parameters and their sensitivities are explained. Several worked telecommunication circuit design examples are given.
This guide establishes test methods for the evaluation of ESD withstand capability for electronic equipment subassemblies. It includes information about test conditions, test equipment, and test procedures for ESD tests…
A practical basis is provided for the selection of voltage and current tests to be applied in evaluating the surge withstand capability of equipment connected to utility power circuits, primarily…
A practical basis is provided for the selection of voltage and current tests to be applied in evaluating the surge withstand capability of equipment connected to utility power circuits, primarily…
This IEEE standards product is part C62 Family on Surge Protection and supersedes C62.41 The scope of this recommended practice is to characterize the surge environment at locations on ac…
