This standard extends IEEE Std 1450-1999 (STIL) to 39 provide an interface between test generation tools and test equipment with regard to the specification of the flow of execution of…
Quantifying the performance of camera-equipped mobile devices is covered in this standard, with an emphasis on metrics and procedures appropriate to the types of sensors, lenses, and signal processing routines…
Information for the implementation of prognostics and health management (PHM) for electronic systems is described in this standard. A normative framework for classifying PHM capability and for planning the development…
Portable/benchtop test equipment applications are supported in this document by defining a mass interconnection scheme and pin configuration based upon IEEE Std 1505(TM)-2010 and IEEE Std 1505.1(TM)-2015. Particular emphasis has…
Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided…
This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document,…
IEEE Std 1838 is a die-centric standard; it applies to a die that is intended to be part of a multi-die stack. This standard defines die-level features that, when compliant…
Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and…
Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a…
