Portable/benchtop test equipment applications are supported in this document by defining a mass interconnection scheme and pin configuration based upon IEEE Std 1505(TM)-2010 and IEEE Std 1505.1(TM)-2015. Particular emphasis has been placed on defining a more specific set of performance requirements than is defined by IEEE Std 1505-2010 and IEEE Std 1505.1-2015. These performance requirements are in the areas of the pin configuration, specific connector modules, and respective contacts.
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Status
- Active Standard
- PAR Approval
- 2011-06-16
- Board Approval
- 2015-09-03
- History
-
- Published:
- 2016-01-20
Working Group Details
- Society
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Working Group
-
HI_WG - Hardware Interfaces Working Group
- IEEE Program Manager
- Christian Orlando
Contact Christian Orlando - Working Group Chair
- Stephen Mann
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
1505.1-2008
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
1505-2010
IEEE Standard for Receiver Fixture Interface
A mechanical and electrical specification for implementing a common interoperable mechanical quick-disconnect interconnect system for use by industry for interfacing large numbers of electrical signals (digital, analog, RF, power, etc.) is provided. These large interface panels (receiver and fixture panels) are employed primarily in test systems between stimulus/measurement assets and a related unit-under-test (UUT), although any application involving high-density contacts requiring a quick disconnect interface could benefit. The receiver is a receptacle that is mounted to test system mates with multiple fixtures, which serve as the buffer between the UUT and automatic test equipment (ATE). Fixtures translate standard input/output (I/O) signal routing offered at the receiver to a wiring interface that directly connects to the UUT. These UUT interfaces can represent cable connectors, direct plug-in (printed circuit board edge connectors), sensor monitoring, or manual feedback from the test technician. The primary objectives of this standard are: (a) to establish interface standards that permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an open architecture; and (b) to develop within this framework a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduced dependence on proprietary designs and extend life-cycle availability.