Tag: Instrumentation and Measurement

Terms critical to the use of fiber optic DAS interrogators along with key definitions of performance parameters used to both fully describe a fiber optic DAS based sensor system and…

This guide outlines basic principles, application objectives, function, performance, and test methods for alternating current (ac) standard signal sources with digital output. It offers an approach for preparing a specification…

This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.

This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis…

Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer…

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1)…

This amendment to IEEE Std 1588-2019 identifies alternative terms for "master" and "slave" used in implementations or PTP profiles; identifies alternative names for port state names; and identifies abbreviations for…

The testability structure for digital circuits described in IEEE Std 1149.1™ has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of…

This standard defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE…