Terms critical to the use of fiber optic DAS interrogators along with key definitions of performance parameters used to both fully describe a fiber optic DAS based sensor system and…
The basic principles, application objectives, functions, performances, and test methods for alternating current (ac) standard signal sources with digital output is outlined in this guide. Aan approach for preparing a…
Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are…
Electrical circuit probes are essential components in the test and evaluation of electrical and electronic systems, subsystems, and circuits. Consequently, having a broadly accepted method for interconnecting the item under…
Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer…
An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined…
This amendment to IEEE Std 1588-2019 identifies alternative terms for "master" and "slave" used in implementations or PTP profiles; identifies alternative names for port state names; and identifies abbreviations for…
The testability structure for digital circuits described in IEEE Std 1149.1™ has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of…
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan…
