This guide specifies basic principles, application objectives, function, performance, and test methods for Alternating Current (AC) standard signal sources with digital output. This guide applies to AC standard signal sources…
This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis…
Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer…
Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the…
Unless the logic inside embedded cores can be merged with the surrounding user-defined logic (UDL), the System on Chip (SoC) test requires reuse of test data and test structures specific…
This amendment to IEEE Std 1588-2019 identifies alternative terms for "master" and "slave" used in implementations or PTP profiles; identifies alternative names for port state names; and identifies abbreviations for…
The testability structure for digital c 1 ircuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the…
This standard defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE…
