Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
- Standard Committee
- C/TT - Test Technology
- Status
- Active Standard
- PAR Approval
- 2020-12-03
- Superseding
- 1450-1999
- Board Approval
- 2023-12-06
- History
-
- Published:
- 2024-04-24
Working Group Details
- Society
- IEEE Computer Society
- Standard Committee
- C/TT - Test Technology
- Working Group
-
STIL_WG - Standard Test Interface Language Working Group
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Ric Dokken
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
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1450-1999
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.