Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.
- Standard Committee
- C/TT - Test Technology
- Status
- Active PAR
- PAR Approval
- 2020-12-03
- Superseding
- 1450.1-2005
Working Group Details
- Society
- IEEE Computer Society
- Standard Committee
- C/TT - Test Technology
- Working Group
-
STIL.1 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Ric Dokken
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