An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems - Status
- Active Standard
- Adoption of
- 1671.4-2014
- History
-
- Published:
- 2016-04-08
Working Group Details
- Society
- IEEE SA Board of Governors
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
No Inactive-Reserved Standards