An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Status
- Inactive-Reserved Standard
- PAR Approval
- 2010-06-17
- Superseding
- 1671.4-2007
- Board Approval
- 2014-03-27
- History
-
- Published:
- 2014-04-30
- Inactivated Date:
- 2025-03-27
Additional Resources
- Downloads
- 1671.4-2014_downloads.zip
Working Group Details
- Society
- Society
- IEEE SA Board of Governors
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Working Group
-
TII_WG - Test Information Integration Working Group
- IEEE Program Manager
- Chinmae Deshmukkh
Contact Chinmae Deshmukkh - Working Group Chair
- Chris Gorringe
Other Activities From This Working Group
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