Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.
- Standard Committee
- N42 -
- Status
- Active Standard
- History
-
- ANSI Approved:
- 2003-02-20
- ANSI Withdrawn Date:
- 2013-08-05
- Published:
- 2003-08-20
Working Group Details
- Society
- Society
- National Committee on Radiation Instrumentation
- Standard Committee
- N42 -
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