Active Standard

IEEE C37.233-2023

IEEE Guide for Power System Protection Testing

Test approaches and procedures for the components and the overall protection and control system functions are presented in this guide. Test of equipment in the system protection scheme, associated communications equipment, auxiliary power supplies, and the control of power apparatus are addressed. Much of the testing emphasizes a bottom-up approach, in which the basic behavior of scheme components are verified first, followed by testing of interconnected components in a function-oriented assembly.

Sponsor Committee
PE/PSRCC - Power System Relaying and Control
Learn More About PE/PSRCC - Power System Relaying and Control
Status
Active Standard
PAR Approval
2015-12-05
Superseding
C37.233-2009
Board Approval
2023-06-05
History
Published:
2023-09-07

Working Group Details

Society
IEEE Power and Energy Society
Learn More About IEEE Power and Energy Society
Sponsor Committee
PE/PSRCC - Power System Relaying and Control
Learn More About PE/PSRCC - Power System Relaying and Control
Working Group
C37.233_WG - Power System Protection Testing Working Group
IEEE Program Manager
Malia Zaman
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Working Group Chair
Don Ware

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C37.233-2009

IEEE Guide for Power System Protection Testing

This guide covers suggested test requirements for power system protection scheme testing, system application tests, the scope and level of tests based on the application, and benefits of the overall protective schemes testing. This guide encompasses overall system testing procedures (generators, line, line reactors, transformer, capacitors, special protection schemes, end-to-end testing, distributed application within substation, etc.) and data collection requirements, as well as the test procedure definitions. This guide describes the methods, extent, and types of system tests for protection applications at various voltage levels. Control functions inherent to the protective systems are included. Importance of line testing, indirect trip applications, open/closed-loop tests, and dynamic/nonlinear tests are also covered.

Learn More About C37.233-2009

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