Withdrawn Standard. Withdrawn Date: Oct 25, 1996. No longer endorsed by the IEEE. A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Status
- Inactive-Withdrawn Standard
- Board Approval
- 1990-02-15
- History
-
- Withdrawn:
- 1996-10-25
- Published:
- 1990-06-29
Working Group Details
- Society
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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