Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
- Standard Committee
- PE/IC - Insulated Conductors
- Status
- Superseded Standard
- PAR Approval
- 2005-03-04
- Superseded by
- 592-2018
- Superseding
- 592-1990
- Board Approval
- 2007-12-05
- History
-
- ANSI Approved:
- 2008-06-03
- Published:
- 2008-05-08
Working Group Details
- Society
- IEEE Power and Energy Society
- Standard Committee
- PE/IC - Insulated Conductors
- Working Group
-
B03W/P592_WG - Exposed Semi-con Test Working Group
- IEEE Program Manager
- Dalisa Gonzalez
Contact Dalisa Gonzalez - Working Group Chair
- Sherif Kamel
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
592-2018
IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors
Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
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These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
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