Active PAR

P2964

Standard for Datasheet Parameters and Tests for Integrated Gate Drivers

The standard provides datasheet parameters and tests for integrated gate drivers, which include non-isolated gate drive, level-shifted gate drive, and isolated gate drive. The standard scope includes terminology, mnemonic, and pins' description; parameters and definitions; and test methods and conditions to obtain the parameters.

Sponsor Committee
IAS/IPCSD - Industrial Power Conversion Systems Department
Learn More About IAS/IPCSD - Industrial Power Conversion Systems Department
Status
Active PAR
PAR Approval
2020-09-24

Working Group Details

Society
IEEE Industry Applications Society
Learn More About IEEE Industry Applications Society
Sponsor Committee
IAS/IPCSD - Industrial Power Conversion Systems Department
Learn More About IAS/IPCSD - Industrial Power Conversion Systems Department
Working Group
DPTIGD - Datasheet Parameters and Tests for Integrated Gate Drivers
IEEE Program Manager
Michael Kipness
Contact Michael Kipness
Working Group Chair
Tanya Gachovska

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


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These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


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These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


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