Active PAR

P2964

Standard for Datasheet Parameters and Tests for Integrated Gate Drivers

The standard provides datasheet parameters and tests for integrated gate drivers, which include non-isolated gate drive, level-shifted gate drive, and isolated gate drive. The standard scope includes terminology, mnemonic, and pins' description; parameters and definitions; and test methods and conditions to obtain the parameters.

Sponsor Committee
IAS/IPCSD - Industrial Power Conversion Systems Department
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Status
Active PAR
PAR Approval
2020-09-24

Working Group Details

Society
IEEE Industry Applications Society
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Sponsor Committee
IAS/IPCSD - Industrial Power Conversion Systems Department
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Working Group
DPTIGD - Datasheet Parameters and Tests for Integrated Gate Drivers
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IEEE Program Manager
Ron Hotchkiss
Contact
Working Group Chair
Tanya Gachovska
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