The standard provides datasheet parameters and tests for integrated gate drivers, which include non-isolated gate drive, level-shifted gate drive, and isolated gate drive. The standard scope includes terminology, mnemonic, and pins' description; parameters and definitions; and test methods and conditions to obtain the parameters.
- Standard Committee
- IAS/IPCSD - Industrial Power Conversion Systems Department
- Status
- Active PAR
- PAR Approval
- 2020-09-24
Working Group Details
- Society
- IEEE Industry Applications Society
- Standard Committee
- IAS/IPCSD - Industrial Power Conversion Systems Department
- Working Group
-
DPTIGD - Datasheet Parameters and Tests for Integrated Gate Drivers
- IEEE Program Manager
- Michael Kipness
Contact Michael Kipness - Working Group Chair
- Tanya Gachovska
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