Active PAR

IEEE P2665

IEEE Draft Recommended Practice for Statistical Process Control for EMC Test Laboratories

This standard provides guidance on how to verify Electromagnetic Compatibility (EMC) test performance through the use of statistical process control (SPC) and specialized setups. By employing SPC a laboratory can monitor the validity of tests by recording data in such a way that trends are detectable and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence to both the laboratory and its customer that test results will be correct.

Sponsor Committee
EMC/SDCom - Standards Development Committee
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Status
Active PAR
PAR Approval
2017-12-06

Working Group Details

Society
IEEE Electromagnetic Compatibility Society
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Sponsor Committee
EMC/SDCom - Standards Development Committee
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Working Group
SPC for EMC Testing - Statistical Process Control for EMC Test Laboratories
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IEEE Program Manager
Jennifer Santulli
Contact
Working Group Chair
Kimball Williams
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