This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified, and dozens of commonly used terms are clearly defined, to aid communication about the quality of tested ICs
- Standard Committee
- C/TT - Test Technology
- Status
- Active PAR
- PAR Approval
- 2018-02-15
Working Group Details
- Society
- IEEE Computer Society
- Standard Committee
- C/TT - Test Technology
- Working Group
-
ACOVERAGE - Analog Defect Coverage
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Anthony Coyette
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