Superseded Standard

IEEE 1671-2006

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).

Standards Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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Status
Superseded Standard
PAR Approval
2004-12-08
Superseded by
1671-2010
Board Approval
2006-09-15
History
Published:
2006-12-15

Additional Resources

Downloads
1671-2006_downloads.zip

Working Group Details

Society
IEEE-SASB Coordinating Committees
Standards Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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Working Group
TII_WG - Test Information Integration Working Group
IEEE Program Manager
Christian Orlando
Contact
Working Group Chair
Chris Gorringe

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


No Active Projects

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


1671.2-2012

IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description

An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).

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1671.4-2014

IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).

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1671.5-2015

IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description

An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.

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1671.6-2015

IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description

An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.

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1871.1-2014

IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters

Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).

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61671-2012

IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.

Learn More

61671-2-2016

IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description

An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).

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These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


1671.2-2008

IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions

This trial-use standard specifies an exchange format, using eXtensible Markup Language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).

Learn More

1671.3-2007

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).

Learn More

1671.4-2007

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).

Learn More

1671.5-2008

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.

Learn More

1671.6-2008

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.

Learn More

These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.


No Inactive-Withdrawn Standards

These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


1671-2010

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.

Learn More

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