The means to define and describe signals used in testing ae provided in this standard. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms.
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems - Status
- Active Standard
- PAR Approval
- 2016-12-07
- Superseding
- 1641-2010
- Board Approval
- 2022-09-21
- History
-
- Published:
- 2023-02-10
Working Group Details
- Society
- IEEE SA Board of Governors
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems - Working Group
-
TAD_WG - Test and ATS Description Working Group
- IEEE Program Manager
- Christian Orlando
Contact Christian Orlando - Working Group Chair
- Ion Neag
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
1671.1-2017
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard. A corri
1671.3-2017
IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.
62529-2024
IEEE/IEC International Standard for Signal and Test Definition
The means to define and describe signals used in testing ae provided in this standard. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms.
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
1641.1-2006
IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
Guidance in the use of the signal and test definition (STD) standard is provided. STD provides the means to define and describe signals used in testing. This guide describes how to implement, apply, and use a set of common basic signals to form complex signals usable across all test platforms.
1671.1-2009
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
1641-2010
IEEE Standard for Signal and Test Definition
This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms. This standard contains additional downloads at http://standards.ieee.org/downloads/1641/1641-2010
1641.1-2013
IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
Guidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means to define and describe signals used in testing. This guide describes how to form complex signals usable across all test platforms.
1641.1a-2018
IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
Amend the guide to add guidelines for producing reusable TSFs for use on platforms utilizing ATML, and produce example TSFs showing conformance with the guidelines. This guide explains how signal definitions and test requirements may be implemented in conformance with IEEE Std 1641-2010. It also provides background information, tutorial support, and examples of signal definitions and test requirements for users of the standard. TSFs are major component for adhering with the IEEE Std 1641. There is little guidance in helping users create their own reusable TSFs or examples that show good practices to copy.
716-1995
IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
A high order language for testing is defined. This language is designed to describe tests in terms that are independent of any specific test system, and has been constrained to ensure that it can be implemented on automatic test equipment.
771-1998
IEEE Guide to the Use of the ATLAS Specification
Guidance in the use of ATLAS test languages is provided. ATLAS may be used to de- scribe test requirements independent of any specific test equipment, and examples of best practice in the use of ATLAS are given.