Active Standard

IEEE 1500-2022

IEEE Approved Draft Standard Testability Method for Embedded Core-based Integrated Circuits

This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.

Sponsor Committee
C/TT - Test Technology
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Status
Active Standard
PAR Approval
2019-09-05
Superseding
1500-2005
Board Approval
2022-06-16

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
1500-2021 - C/TT/1500 Standard Testability Method for Embedded Core-based Integrated Circuits
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IEEE Program Manager
Tom Thompson
Contact
Working Group Chair
Mike Ricchetti
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