Superseded Standard

IEEE 1149.1-2001

IEEE Standard Test Access Port and Boundary Scan Architecture

Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.

Sponsor Committee
C/TT - Test Technology
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Status
Superseded Standard
PAR Approval
1997-06-26
Superseded by
1149.1-2013
Superseding
1149.1-1990
Board Approval
2001-06-14
History
ANSI Approved:
2001-10-25
Published:
2001-07-23
Reaffirmed:
2008-03-27

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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