Tag: Instrumentation and Measurement

Withdrawn Standard. Withdrawn Date: Jan 16, 2004. The overall concept of A Broad-Based Environment for Test (ABBET) TM is defined, and mandatory requirements for implementation of ABBET are specified. The…

Standard frequency generators that include all atomic frequency standards and precision quartz crystal oscillators are addressed.

Standard frequency generators that include all atomic frequency standards and precision quartz crystal oscillators are addressed.

A serial, full-duplex, asynchronous, 9-pin data terminal equipment (DTE) communications port for programmable instrumentation that follows ANSI/TIA/EIA-574-1990 and related standards is defined in this standard.

Methods of describing random instabilities of importance to frequency and time metrology is covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude,…

Methods of describing random instabilities of importance to frequency and time metrology is covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude,…

Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface…

Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface…

A test access port and boundary-scan architecture for digital integrated circuits and for the digital portions of mixed analog/digital integrated circuits are discussed. These facilities seek to provide a solution…