Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined.…
This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common…
The framework for the reliability prediction for electronic hardware is covered in this standard. This standard identifies required elements for an understandable and credible reliability prediction with information to evaluate…
Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are…
This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals…
Revision of IEEE Std 1057-1994. This standard defines specifications and describes test methods for measuring the performance of electronic digitizing waveform recorders, waveform analyzers, and digitizing oscilloscopes with digital outputs.…
A mechanical and electrical specification for implementing a common interoperable mechanical quick-disconnect interconnect system for use by industry for interfacing large numbers of electrical signals (digital, analog, RF, power, etc.)…
This standard defines a protocol enabling precise synchronization of clocks in measurement and control systems implemented with technologies such as network communication, local computing and distributed objects. The protocol is…
The guide specifies procedures for testing equipment when external insulation of the test object is subjected to combinations of contamination, ice, snow, or cold fog. The methods are applicable only…
