Tag: Instrumentation and Measurement

IEEE Standard for Digital Test Interchange Format (DTIF)

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed…

IEEE Standard for Jitter and Phase Noise

This standard would fulfill the lack of uniformity by defining all terms involved in jitter definition, by identifying all jitter components and by modelling them. In this standard a new…

IEEE Standard for Digitizing Waveform Recorders

Terminology and test methods for describing the performance of waveform recorders are presented in this standard.

IEEE Standard Design Criteria of Complex Virtual Instruments for Ocean Observation

The framework of building a distributed ocean observing software system based on complex virtual instruments (CVIs), which are used for processing and displaying the collected data from ocean instruments and…

IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language

Amend the guide to add guidelines for producing reusable TSFs for use on platforms utilizing ATML, and produce example TSFs showing conformance with the guidelines. This guide explains how signal…

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture

Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die…

IEEE Standard for Wind Turbine Aero Acoustic Noise Measurement Techniques

Techniques to select wind turbine and wind farm aero acoustic noise measurements, including instrumentation standards and metrology technology, measurement set, measurement procedures, data processing, and noise source data analysis are…

IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology

The preferred metric units for use in Electrical and Electronics Science and Technology is provided by this recommended practice. The application of IEEE/ASTM SI 10 is supported.

IEEE Standard Reliability Program for the Development and Production of Electronic Products

A standard set of reliability program objectives for use between customers and producers, or within product development teams, to express reliability program requirements early in the development phase of electronic…
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