The scope of this standard is the definition of a descriptive language, including vocabulary and grammar, to describe functional test sequences (also called patterns) for memory devices.
Guidelines under which data sheets for new semiconductor memories are to be generated are provided. Adherence to these guidelines is intended to produce data sheets that are concise and that…
Withdrawn Standard. Withdrawn Date: Dec 06, 1990. This standard applies to electrothermic power meters as complete instruments and to their constituent parts: electrothermic elements, electrothermic units, and electrothermic power indicators.…
Superseded by 488.1-2003. Interface systems used to interconnect both programmable and nonprogrammable electronic measuring apparatus with other apparatus and accessories necessary to assemble instrumentation systems are considered. The standard applies…
This standard applies to interface systems used to interconnect both programmable and nonprogrammable electronic measuring apparatus with other apparatus and accessories necessary to assemble instrumentation systems. It applies to the…
A set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication protocols that are necessary to effect…
