The dimensions and functions of test blocks and cabinets used with self-contained A-base watthour meters are covered. Standard ratings are defined, and general requirements are addressed.
This standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test…
Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, data formats, and file formats are included.
This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL)…
Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained…
The STIL environment supports transferring tester-independent test programs to a specific ATE system. Although native STIL data are tester independent, the actual process of mapping the test program onto tester…
This standard defines an object model with a network-neutral interface for connecting processors to communication networks, sensors, and actuators. The object model containing blocks, services, and components specifies interactions with…
A digital interface for connecting transducers to microprocessors is defined. A TEDS and its data formats are described. An electrical interface, read and write logic functions to access the TEDS…
A digital interface for connecting multiple physically separated transducers to a single processor over a single pair of wires. The interface can support both asynchronous and isochronous data transfers. Several…
