This specification describes circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1TM-2001. The circuitry uses IEEE…
This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and…
Interoperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of maintenance action information (MAI) associated with the removal, repair, and replacement of…
This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).
An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used…
An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used…
Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and Service Tie to All Test Environments (AIESTATE). The purpose of AI-ESTATE is…
This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate,…
This trial-use standard specifies an exchange format, using eXtensible Markup Language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used…
