Tag: Instrumentation and Measurement

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is…
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IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture

This specification describes circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1TM-2001. The circuitry uses IEEE…
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and…
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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)

Interoperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of maintenance action information (MAI) associated with the removal, repair, and replacement of…
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used…
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used…
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IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and Service Tie to All Test Environments (AIESTATE). The purpose of AI-ESTATE is…
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate,…
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