IEEE 1641.1a-2018 - IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language

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Amend the guide to add guidelines for producing reusable TSFs for use on platforms utilizing ATML, and produce example TSFs showing conformance with the guidelines. This guide explains how signal definitions and test requirements may be implemented in conformance with IEEE Std 1641-2010. It also provides background information, tutorial support, and examples of signal definitions and test requirements for users of the standard. TSFs are major component for adhering with the IEEE Std 1641. There is little guidance in helping users create their own reusable TSFs or examples that show good practices to copy.

Sponsor Committee	SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Status	Active
Board Approval	2018-03-08
History	Published Date:2018-08-15

Additional Resources Details

Pars	Approved PAR

Working Group Details

Working Group	TAD_WG - Test and ATS Description Working Group
Working Group Chair	Ion Neag
Sponsor Committee	SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Society	IEEE-SASB Coordinating Committees
IEEE Program Manager	Christian Orlando
Existing Standards	Superseded IEEE 1641.1-2006 - IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition Guidance in the use of the signal and test definition (STD) standard is provided. STD provides the means to define and describe signals used in testing. This guide describes how to implement, apply, and use a set of common basic signals to form complex signals usable across all test platforms.
	Superseded IEEE 1671.1-2009 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.
	Inactive-Reserved IEEE 1641-2010 - IEEE Standard for Signal and Test Definition This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms. This standard contains additional downloads at http://standards.ieee.org/downloads/1641/1641-2010
	Active IEEE 1641.1-2013 - IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition Guidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means to define and describe signals used in testing. This guide describes how to form complex signals usable across all test platforms.
	Active IEEE 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.
	Active IEEE 1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.