Standard Details
IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
| Sponsor Committee | |
| Status |
Active
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| Board Approval |
2015-12-05
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| History |
Published Date:2016-03-18
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Additional Resources Details
| PAR |
Working Group Details
| Working Group |
1149.6 - Boundary Scan Testing of Advanced Digital Networks Working Group
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| Working Group Chair |
William Eklow
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| Sponsor Committee | |
| Society | |
| IEEE Program Manager | |
| Existing Standards |
his standard augments IEEE Std 1149.1 to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
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