IEEE 1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks

Standard

Active

Standard Details

IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.

Standards Committee	C/TT - Test Technology
Status	Active
Board Approval	2015-12-05
History	Published Date:2016-03-18

Additional Resources Details

PAR	Approved PAR

Working Group Details

Working Group	1149.6 - Boundary Scan Testing of Advanced Digital Networks Working Group
Working Group Chair	William Eklow
Standards Committee	C/TT - Test Technology
Society	IEEE Computer Society
IEEE Program Manager	Tom Thompson
Existing Standards	Superseded IEEE 1149.6-2003 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks his standard augments IEEE Std 1149.1 to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.