IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
- Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Status
- Active Standard
- PAR Approval
- 2009-09-11
- Superseding
- 1149.6-2003
- Board Approval
- 2015-12-05
- History
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- ANSI Approved:
- 2017-05-04
- Published:
- 2016-03-18
Working Group Details
- Society
- IEEE Computer Society
Learn More About IEEE Computer Society - Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Working Group
-
1149.6 - Boundary Scan Testing of Advanced Digital Networks Working Group
- IEEE Program Manager
- Tom Thompson
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1149.6-2003
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
his standard augments IEEE Std 1149.1 to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
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