his standard augments IEEE Std 1149.1 to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
- Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Status
- Superseded Standard
- PAR Approval
- 2002-02-14
- Superseded by
- 1149.6-2015
- Board Approval
- 2003-03-20
- History
-
- ANSI Approved:
- 2003-06-19
- Published:
- 2003-04-17
Working Group Details
- Society
- IEEE Computer Society
Learn More About IEEE Computer Society - Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Working Group
-
1149.6 - Boundary Scan Testing of Advanced Digital Networks Working Group
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson
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1149.6-2015
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
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