PC62.59 - IEEE Draft Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
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This standard defines the basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations or network operators.
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PAR Approval
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IEEE Program Manager
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Existing Standards