This standard defines extensions to IEEE Std 1149.1. It standardizes the boundary-scan structures and methods required to help ensure simple, robust, and minimally intrusive boundary-scan testing of advanced digital networks. Such networks are not adequately addressed by existing standards, especially for those networks that are ac-coupled, differential, or both. Testing enabled by this standard operates in parallel with the testing of conventional digital networks according to IEEE Std 1149.1 and in conjunction with the testing of conventional analog networks according to IEEE Std 1149.4. This standard also specifies software and Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1, which are required to support new I/O test structures.
- Standard Committee
- C/TT - Test Technology
- Status
- Active PAR
- PAR Approval
- 2024-09-26
- Superseding
- 1149.6-2015
Working Group Details
- Society
- IEEE Computer Society
- Standard Committee
- C/TT - Test Technology
- Working Group
-
1149.6 - Boundary Scan Testing of Advanced Digital Networks Working Group
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Saghir Shaikh
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
1149.6-2015
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
1149.6-2003
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
his standard augments IEEE Std 1149.1 to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
No Inactive-Reserved Standards