IEEE Standards Association
IEEE Project
P1696 - Standard for Terminology and Test Methods for Circuit Probes
This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.
- Status:
Working Group: Probe - Subcommittee on Probe Standards
Get Involved In The Development Of This Standard
Contact the IEEE-SA Liaison Simply click here to voice your interest. Kathryn Bennett
Learn More About Standards ParticipationAnyone can participate, there are a variety of programs and services to
facilitate the involvement of industry and the public. More
Become a Member and Ballot on this StandardMembership empowers you to participate & lead in the development of
standards. Tell Me More
Standards Help
IEEE-SA Standards Development Services are proven to expedite the process by 40%. Click here to learn more!