IEEE 1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description

Standard Details

An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.

Sponsor Committee	SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Status	Active
Board Approval	2015-03-26
History	Published Date:2015-05-08

Additional Resources Details

Pars	Approved PAR
Downloads	1671.6-2015_downloads.zip

Working Group Details

Working Group	TII_WG - Test Information Integration Working Group
Working Group Chair	Chris Gorringe
Sponsor Committee	SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Society	IEEE-SASB Coordinating Committees
IEEE Program Manager	Christian Orlando
Existing Standards	Active IEEE 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).
	Active IEEE 1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).
	Active IEEE 1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.
	Active IEEE 1871.1-2014 - IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).
	Active IEEE/IEC 61671-2-2016 - IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).