An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Status
- Active Standard
- PAR Approval
- 2010-06-17
- Superseding
- 1671.5-2008
- Board Approval
- 2015-03-26
- History
-
- ANSI Approved:
- 2016-08-22
- Published:
- 2015-05-08
Additional Resources
- Downloads
- 1671.5-2015_downloads.zip
Working Group Details
- Society
- Society
- IEEE SA Board of Governors
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Working Group
-
TII_WG - Test Information Integration Working Group
- IEEE Program Manager
- Chinmae Deshmukkh
Contact Chinmae Deshmukkh - Working Group Chair
- Chris Gorringe
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
No Inactive-Reserved Standards