This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.
- Standard Committee
- PE/SWG - Switchgear
- Status
- Superseded Standard
- PAR Approval
- 2002-12-11
- Superseded by
- C37.26-2014
- Superseding
- C37.26-1972
- Board Approval
- 2003-09-11
- History
-
- ANSI Approved:
- 2003-12-29
- Published:
- 2004-02-26
- Reaffirmed:
- 2009-03-19
Working Group Details
- Society
- IEEE Power and Energy Society
- Standard Committee
- PE/SWG - Switchgear
- Working Group
-
LVSD/C37.26 - C37.26 - IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
- IEEE Program Manager
- Jennifer Santulli
Contact Jennifer Santulli - Working Group Chair
- T W Olsen
Other Activities From This Working Group
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No Active Projects
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C37.26-2014
IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits
Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages.
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