This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.
- Standard Committee
- EDS -
- Status
- Inactive-Withdrawn Standard
- Board Approval
- 1987-09-10
- History
-
- Withdrawn:
- 1992-12-03
- ANSI Approved:
- 1988-02-19
- Published:
- 1988-10-07
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- Standard Committee
- EDS -
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