This standard specifies the general requirements of visual inspection of surface mount devices (SMD) for surface mount technology (SMT) machines, including the format of chip parameters data exchange, the function and technical requirements of each module of the visual inspection algorithm, and the storage structure of chip parameters. This standard specifies unified data format and interfaces of the algorithms between different SMT machines.
- Sponsor Committee
- IES/IES - Industrial Electronics Society Standards Committee
Learn More About IES/IES - Industrial Electronics Society Standards Committee - Status
- Active PAR
- PAR Approval
- 2021-12-08
Working Group Details
- Society
- IEEE Industrial Electronics Society
- Sponsor Committee
- IES/IES - Industrial Electronics Society Standards Committee
Learn More About IES/IES - Industrial Electronics Society Standards Committee - Working Group
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CVISMI - Chips Visual Inspection in Surface Mount Industry
- IEEE Program Manager
- Vanessa Lalitte
Contact Vanessa Lalitte - Working Group Chair
- Xianqiang Yang
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