This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
- Sponsor Committee
- C/MSC - Microprocessor Standards Committee
Learn More About C/MSC - Microprocessor Standards Committee - Status
- Superseded Standard
- PAR Approval
- 2003-06-12
- Superseded by
- 1620-2008
- Board Approval
- 2004-02-09
- History
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- ANSI Approved:
- 2004-05-12
- Published:
- 2004-04-29
Working Group Details
- Society
- IEEE Computer Society
Learn More About IEEE Computer Society - Sponsor Committee
- C/MSC - Microprocessor Standards Committee
Learn More About C/MSC - Microprocessor Standards Committee - Working Group
-
1620_WG - Working Group for Organic and Molecular Electronics
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Daniel Gamota
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
1620-2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.
1620.1-2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.